INFRARED DEVICE

An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35)....

Full description

Saved in:
Bibliographic Details
Main Authors Zäch, Nicolas, Winger, Martin
Format Patent
LanguageEnglish
French
German
Published 25.10.2023
Subjects
BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

More Information
Summary:An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35). In addition, one or more of a thermal sensor (5) arranged for sensing the infrared radiation absorbed by the configuration (3), and a heater (7) arranged for heating the configuration (3) to emit the infrared radiation is supported by the substrate (1)
Bibliography:Application Number: EP20170193760