GAS ANALYSIS APPARATUS, PROGRAM FOR GAS ANALYSIS APPARATUS, AND GAS ANALYSIS METHOD

• Main Author: TAKAHASHI, Motonobu
• Format: Patent
• Language: English; French; German
• Published: 16.01.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To make it possible to analyze using highly accurate calibration curve data obtained by correcting influences of measurement target components contained in a sample gas without correcting an influence of a component not contained in the sample gas, a gas analysis apparatus includes a calibration curve data storage section (21) designed to store N types of calibration curve data which are previously created for N types of measurement target components and obtained by correcting influences of other N-1 types of measurement target components with respect to a concentration of each of the measurement target components, and a concentration calculation section (22) designed to calculate a concentration of each of the measurement target components by using the N types of calibration curve data. When there exists a subthreshold component whose concentration calculated by the concentration calculation section (22) is not more than a predetermined threshold value, the concentration calculation section (22) calculates a concentration of each of the measurement target components other than the subthreshold component by using calibration curve data obtained without correcting an influence of the subthreshold component.