SYSTEMS AND METHODS FOR SUB-PIXEL LOCATION DETERMINATION AT SIDEWALLS AND CORNERS OF DETECTORS

A radiation detector system 100 is provided that includes a semiconductor detector 110, plural pixelated anodes 111, 114, 115, 117, 119, and a side anode 130. The semiconductor detector 110 has a surface 112. The pixelated anodes 114 are disposed on the surface 112, and are arranged in a grid 116 de...

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Bibliographic Details
Main Authors BOUHNIK, Jean-Paul, SHAHAR, Arie
Format Patent
LanguageEnglish
French
German
Published 10.07.2024
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:A radiation detector system 100 is provided that includes a semiconductor detector 110, plural pixelated anodes 111, 114, 115, 117, 119, and a side anode 130. The semiconductor detector 110 has a surface 112. The pixelated anodes 114 are disposed on the surface 112, and are arranged in a grid 116 defining a footprint 118. The side anode 130 is disposed outside of the footprint defined by the plural pixelated anodes 114, and has a length 132 extending along at least two of the pixelated anodes 114.
Bibliography:Application Number: EP20170206675