THERMAL MITIGATION BASED ON PREDICATED TEMPERATURES

An apparatus is presented. The apparatus includes a first circuit configured to predict temperatures of a location for a plurality of time instances based on measured temperatures and a second circuit configured to schedule a thermal mitigation function based on the predicted temperatures. A method...

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Bibliographic Details
Main Author CHANDRA, Rajit
Format Patent
LanguageEnglish
French
German
Published 13.09.2017
Subjects
CALCULATING
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Summary:An apparatus is presented. The apparatus includes a first circuit configured to predict temperatures of a location for a plurality of time instances based on measured temperatures and a second circuit configured to schedule a thermal mitigation function based on the predicted temperatures. A method of operating an apparatus is presented. The method includes measuring temperatures on an integrated circuit, predicting temperatures of a location for a plurality of time instances based on the measured temperatures, and scheduling a thermal mitigation function based on the predicted temperatures. An apparatus is presented. The apparatus includes means for measuring temperatures on an integrated circuit, means for predicting temperatures of a location for a plurality of time instances based on measured temperatures, and means for scheduling a thermal mitigation function based on the predicted temperatures.
Bibliography:Application Number: EP20150782157