SPECTROPHOTOMETER

The invention relates to a spectrophotometer, especially a spectrophotometer that can carry out simultaneous analysis at different points on the same sample (4), with a high spatial resolution and without requiring a mechanical system for physical scanning along the sample. This is obtained by the p...

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Bibliographic Details
Main Authors TAMAYO DE MIGUEL, Francisco, Javier, MONTEIRO KOSAKA, Priscila, RAMOS VEGA, Daniel, RUZ MARTINEZ, Jose Jaime, PINI, Valerio, CALLEJA GOMEZ, Montserrat, ENCINAR DEL POZO, Mario, MALVAR VIDAL, Oscar
Format Patent
LanguageEnglish
French
German
Published 26.01.2022
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:The invention relates to a spectrophotometer, especially a spectrophotometer that can carry out simultaneous analysis at different points on the same sample (4), with a high spatial resolution and without requiring a mechanical system for physical scanning along the sample. This is obtained by the provision of means for processing the light received by the photodetectors (5), said processing means having a correlation wherein each of the photodetectors (5) corresponds to a spatial point on the sample (4). In the case of dark field applications, the present invention ensures the standardization of the data using the same measure.
Bibliography:Application Number: EP20150849137