SYSTEM AND METHOD FOR MONITORING COMPONENT STRAIN

A system for monitoring a component (10) is provided. The system may include a strain sensor (40) configured on the component (10), an electrical field scanner (60) for analyzing the strain sensor (40), and a processor (100) in operable communication with the electrical field scanner (60). The proce...

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Bibliographic Details
Main Authors BATZINGER, Thomas James, RANSON, William F, GERMANN, Bryan Joseph
Format Patent
LanguageEnglish
French
German
Published 24.07.2024
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:A system for monitoring a component (10) is provided. The system may include a strain sensor (40) configured on the component (10), an electrical field scanner (60) for analyzing the strain sensor (40), and a processor (100) in operable communication with the electrical field scanner (60). The processor (100) may be operable for measuring an electrical field value across the strain sensor (40) along a mutually-orthogonal X-axis and Y-axis to obtain a data point set. The processor (100) may further be operable for assembling a field profile of the strain sensor (40) based on the data point set. Methods of using the system are also provided.
Bibliography:Application Number: EP20160200201