METHOD AND SYSTEM FOR ANALYSING AN OBJECT BY DIFFRACTOMETRY USING A SCATTER SPECTRUM AND A TRANSMISSION SPECTRUM

A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in tran...

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Bibliographic Details
Main Authors PAULUS, Caroline, TABARY, Joachim
Format Patent
LanguageEnglish
French
German
Published 06.05.2020
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.
Bibliography:Application Number: EP20150742349