SYSTEM AND METHOD FOR DETERMINING X-RAY EXPOSURE PARAMETERS
In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English French German |
Published |
19.04.2017
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Subjects | |
Online Access | Get full text |
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Summary: | In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-ray detector further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The X-ray detector further includes a determination module configured to calculate one or more main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics. The determination module is further configured to send the one or more main-shot parameters to the source controller of the X-ray imaging system. |
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Bibliography: | Application Number: EP20150795044 |