BONDING WIRE FOR SEMICONDUCTOR DEVICE
There is provided a bonding wire that improves bonding reliability of a ball bonded part and ball formability and is suitable for on-vehicle devices. The bonding wire for a semiconductor includes a Cu alloy core material, and a Pd coating layer formed on a surface of the Cu alloy core material, and...
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Main Authors | , , |
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Format | Patent |
Language | English French German |
Published |
14.03.2018
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Subjects | |
Online Access | Get full text |
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Abstract | There is provided a bonding wire that improves bonding reliability of a ball bonded part and ball formability and is suitable for on-vehicle devices. The bonding wire for a semiconductor includes a Cu alloy core material, and a Pd coating layer formed on a surface of the Cu alloy core material, and is characterized in that the Cu alloy core material contains Ni, a concentration of Ni is 0.1 to 1.2 wt.% relative to the entire wire, and a thickness of the Pd coating layer is 0.015 to 0.150 µm. |
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AbstractList | There is provided a bonding wire that improves bonding reliability of a ball bonded part and ball formability and is suitable for on-vehicle devices. The bonding wire for a semiconductor includes a Cu alloy core material, and a Pd coating layer formed on a surface of the Cu alloy core material, and is characterized in that the Cu alloy core material contains Ni, a concentration of Ni is 0.1 to 1.2 wt.% relative to the entire wire, and a thickness of the Pd coating layer is 0.015 to 0.150 µm. |
Author | UNO Tomohiro OYAMADA Tetsuya DEAI Hiroyuki |
Author_xml | – fullname: OYAMADA Tetsuya – fullname: DEAI Hiroyuki – fullname: UNO Tomohiro |
BookMark | eNrjYmDJy89L5WRQdfL3c_H0c1cI9wxyVXDzD1IIdvX1dAYKhjqHAHkurmGezq48DKxpiTnFqbxQmptBwc01xNlDN7UgPz61uCAxOTUvtSTeNcDY0NjMxMjc0cSYCCUAOOEkmg |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
DocumentTitleAlternate | VERBINDUNGSDRAHT FÜR HALBLEITERBAUELEMENT CÂBLE DE CONNEXION POUR DISPOSITIF SEMI-CONDUCTEUR |
ExternalDocumentID | EP3136427A4 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_EP3136427A43 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 13:02:48 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English French German |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_EP3136427A43 |
Notes | Application Number: EP20150782477 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180314&DB=EPODOC&CC=EP&NR=3136427A4 |
ParticipantIDs | epo_espacenet_EP3136427A4 |
PublicationCentury | 2000 |
PublicationDate | 20180314 |
PublicationDateYYYYMMDD | 2018-03-14 |
PublicationDate_xml | – month: 03 year: 2018 text: 20180314 day: 14 |
PublicationDecade | 2010 |
PublicationYear | 2018 |
RelatedCompanies | Nippon Micrometal Corporation Nippon Steel & Sumikin Materials Co., Ltd |
RelatedCompanies_xml | – name: Nippon Steel & Sumikin Materials Co., Ltd – name: Nippon Micrometal Corporation |
Score | 3.1316826 |
Snippet | There is provided a bonding wire that improves bonding reliability of a ball bonded part and ball formability and is suitable for on-vehicle devices. The... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | ALLOYS BASIC ELECTRIC ELEMENTS CHEMISTRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FERROUS OR NON-FERROUS ALLOYS METALLURGY SEMICONDUCTOR DEVICES TREATMENT OF ALLOYS OR NON-FERROUS METALS |
Title | BONDING WIRE FOR SEMICONDUCTOR DEVICE |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180314&DB=EPODOC&locale=&CC=EP&NR=3136427A4 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dT8Iw8IJo1DdFDfiVPejeFulW6PawGNd1MhO2BQfyRsZWEl6QyIx_3-sy0Bd9u16Ta3vJ9T57BbijJC8y1AxGtqCOQWWvbziLjBmUsIKiBZs7UsUhh1F_MKYv0960AcvtW5iqT-hX1RwRJSpHeS-r-3r9E8Tyq9rKzcN8iaj3xyB1fb32jomturHrvueKJPZjrnOOkB6NXItYaGmzJ7oH-2hFM1X9JSaeepSy_q1RghM4SJDYqjyFhly14IhvP15rweGwzncjWIve5gzuvTjyw-hZewtHQkPfTXtVLETkmKc48sUk5OIctECkfGDgerPd2WYi2e3MuoAmuvyyDRozM9POWCFJN6O203XMwpIqZaI-BZNW3oHOn2Qu_5m7gmPFJFVDReg1NMuPT3mDSrWc31bs-AYn9XZ1 |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1NT4Mw9GVO47zp1Dg_OSg34oBuwIEYKUXQActkczfCoEt2mYvD-Pd9JWx60Vv7mry2L3l9H30fALdEzYsMJYOSzYmlEN7rK9Y8MxSiGgVBDTa3uPBDhlHfH5PnaW_agMUmF6aqE_pVFUdEjsqR38vqvV79OLHcKrZyfT9bIOj9wUtsV66tY9UU1dhl17HZMHZjKlOKIzka2bqqo6ZtPJId2EUN2xRl9tnEEUkpq98SxTuEvSEiW5ZH0ODLNrTopvFaG_bD-r8bhzXrrY_hzokjN4iepLdgxCS03aRXQUIEjmmCM5dNAspOQPJYQn0F90u3d0vZcHsy_RSaaPLzM5AMLdPMzCi42s2IaXUtrdC5-DIRTcG4nneg8yea83_WbqDlJ-EgHQTRywUcCIKJeCqVXEKz_PjkVyhgy9l1RZpv3Uh5ZQ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=BONDING+WIRE+FOR+SEMICONDUCTOR+DEVICE&rft.inventor=OYAMADA+Tetsuya&rft.inventor=DEAI+Hiroyuki&rft.inventor=UNO+Tomohiro&rft.date=2018-03-14&rft.externalDBID=A4&rft.externalDocID=EP3136427A4 |