METHOD OF MODELING CHARACTERISTICS OF A NON LINEAR SYSTEM

• Main Authors: WANG, Tien-Ming, SIAO, Yi-Song, YEH, Yi-Fan
• Format: Patent
• Language: English; French; German
• Published: 01.03.2017
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method of modeling (fig. 4, fig. 5) a characteristic of a non-linear system (21), comprises feeding test input signals (Sig6, Sig7) into the non-linear system (21) to obtain test output signals (Resp6, Resp7), wherein the test input signals (Sig6, Sig7) include a first test input signal (Sig6) and the test output signals (Resp6, Resp7) include a first test output signal (Resp6), identifying occurrences when an output level in at least one specific frequency band of the first testing output signal significantly changes under the first test input signal (e.g. identifying the frequencies at which there are overtones) so as to obtain a first profile (Profile B: frequency index versus input level, fig. 7), and modeling the characteristic (e.g. frequency response of pre-amplifier stage, fig. 8) based on the first profile (fig. 20). Various test input signals may be used : Amplitude sweep (fig. 6a-c), frequency sweep (fig. 10), white noise or chirp signal. The breakup point of overtones onsets in the table of frequency bins versus input signal is determined. The application of this profile to model the non-linear amplifier stage of a music instrument, for instance a guitar, is also defined.