OPTICAL MICROSCOPY SYSTEM AND METHOD FOR RAMAN SCATTERING WITH ADAPATIVE OPTICS

An optical apparatus for Raman scattering microscopy includes a laser source that emits a laser beam at an excitation wavelength λ, a microscope objective that receives the laser beam and focuses the laser beam in an image plane of the microscope objective, the focused laser beam being intended to i...

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Bibliographic Details
Main Authors DUTERTRE, Bertrand, FRETEL, Emmanuel, CATTELAN, Denis
Format Patent
LanguageEnglish
French
German
Published 04.01.2017
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:An optical apparatus for Raman scattering microscopy includes a laser source that emits a laser beam at an excitation wavelength λ, a microscope objective that receives the laser beam and focuses the laser beam in an image plane of the microscope objective, the focused laser beam being intended to illuminate a sample, an optical system for collecting a Raman scattering optical beam, and detection elements suitable for detecting the Raman scattering beam collected. More particularly, the Raman scattering microscopy apparatus further includes an adaptive optics system positioned on an optical path of the Raman scattering beam, the said adaptive optics system is configured to form the image of an energy distribution inside the confocal hole on the entrance slit of the spectrometer in such a way as to obtain an energy distribution in a direction of a height of the slit.
Bibliography:Application Number: EP20150715783