METHOD AND X-RAY INSPECTION SYSTEM, IN PARTICULAR FOR NON-DESTRUCTIVELY INSPECTING OBJECTS

This disclosure relates to methods for non-destructively inspecting an object, wherein electromagnetic radiation is passed through the object and intensity values of unabsorbed beams are measured and evaluated. The method can include generating a three-dimensional data set in which a first material...

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Bibliographic Details
Main Authors NAUMANN, DIRK, NITTIKOWSKI, JÖRG, MADER, ANDREAS, KÖNIG, SEBASTIAN, DREISEITEL, PIA
Format Patent
LanguageEnglish
French
German
Published 23.11.2016
Subjects
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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Summary:This disclosure relates to methods for non-destructively inspecting an object, wherein electromagnetic radiation is passed through the object and intensity values of unabsorbed beams are measured and evaluated. The method can include generating a three-dimensional data set in which a first material property of the object is associated with individual spatial elements of the object using computed tomography; determining an inspection space, in the three-dimensional data set; deriving values, based on the three-dimensional data set, corresponding to a spatial geometric quantity of the inspection space in a predetermined projection direction; generating a two-dimensional data set in which a second material property of the object is associated with individual surface elements of the object, using two-dimensional X-ray; determining an inspection region in the two-dimensional data set by computing a projection of the inspection space into the two-dimensional data set; and transferring the derived values into corresponding surface elements of the projection.
Bibliography:Application Number: EP20150700396