EXAMINATION DEVICE

An examination (1) device includes a hammer portion (31) configured to tap an object (100), a detection portion (33) configured to detect a vibration caused by the hammer portion (31) tapping the object (100), a calculation portion (41) configured to calculate a number of times the hammer portion (3...

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Bibliographic Details
Main Author OTOMO, MASAKI
Format Patent
LanguageEnglish
French
German
Published 14.09.2016
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An examination (1) device includes a hammer portion (31) configured to tap an object (100), a detection portion (33) configured to detect a vibration caused by the hammer portion (31) tapping the object (100), a calculation portion (41) configured to calculate a number of times the hammer portion (31) has impinged on the object (100) regarding a single tapping operation of the hammer portion (31), based on the vibration detected by the detection portion (33), and a determination portion (42) configured to determine quality of the object (100), based on the number of times calculated by the calculation portion (41).
Bibliography:Application Number: EP20140860586