SPECTROMETRY SYSTEM AND METHOD, SPECTROSCOPIC DEVICES AND SYSTEMS

• Main Authors: KAPLAN, MENAHEM, GOLDRING, DAMIAN, ROSEN, SAGEE, ENGELHARDT, KAI, RUF, AMIT, KEILAF, OMER, SHARONOR, BRODETZKI, GUY, NIR, ITTAI, KINROT, URI
• Format: Patent
• Language: English; French; German
• Published: 08.06.2016
• Subjects: COLORIMETRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING

A spectrometer comprising an illuminator for illuminating a sample with light, the illuminator comprising a primary radiation emitter to emit primary radiation within a first wavelength range, and a secondary radiation emitter to absorb the primary radiation and to emit secondary radiation within a second wavelength range different from the first wavelength range; and a spectrometer module for receiving light reflected from the sample, the spectrometer module comprising a diffuser; a detector comprising a plurality of regions, each region of said plurality of regions comprising multiple sensors; a lens array comprising a plurality of lenses, each lens of the lens array corresponding to a region of said plurality of regions; and a filter array corresponding to the lens array, the filter array comprising a plurality of filters, wherein each filter of the plurality of filters is configured to transmit a range of wavelengths different from other filters of the plurality.