SYSTEMS AND METHODS FOR MEASURING AND CHARACTERIZING INTERIOR SURFACES OF LUMINAL STRUCTURES
A digital topographic model of the luminal surface is generated by projecting an optical pattern on the luminal surface from the first location within the lumen. At least a portion of the projected pattern is detected from a second location within the lumen which is based apart from the first locati...
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Main Author | |
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Format | Patent |
Language | English French German |
Published |
09.03.2016
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Subjects | |
Online Access | Get full text |
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Summary: | A digital topographic model of the luminal surface is generated by projecting an optical pattern on the luminal surface from the first location within the lumen. At least a portion of the projected pattern is detected from a second location within the lumen which is based apart from the first location. The dimensions of the luminal wall can be measured by triangulation in order to produce the digital topographic model of the body lumen. |
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Bibliography: | Application Number: EP20140791528 |