TRI-MODE PROBE WITH AUTOMATIC SKEW ADJUSTMENT

A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the elec...

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Bibliographic Details
Main Authors KNIERIM, DANIEL, ROCKWELL, MARTIN, MUGGLI, CHRISTOPHER, POLLOCK, IRA
Format Patent
LanguageEnglish
French
German
Published 17.02.2016
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.
Bibliography:Application Number: EP20150178827