LIGHT ANALYZING DEVICE EVALUATION METHOD AND PHANTOM SAMPLE

An optical system of an optical analysis device is easily evaluated with high accuracy. There is provided a method of evaluating an optical analysis device including an optical system A capable of forming a confocal volume C at a focal position by condensing excitation light B, the method including...

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Bibliographic Details
Main Author YAMAGUCHI, MITSUSHIRO
Format Patent
LanguageEnglish
French
German
Published 09.11.2016
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:An optical system of an optical analysis device is easily evaluated with high accuracy. There is provided a method of evaluating an optical analysis device including an optical system A capable of forming a confocal volume C at a focal position by condensing excitation light B, the method including the steps of: placing, at the focal position of the optical system A, a phantom sample (1) in which two or more types of solid members (2, 3) having different fluorescent substance concentrations are arranged adjacent to each other; irradiating the phantom sample 1 with excitation light through the optical system A while relatively moving the confocal volume C formed by the optical system A and the phantom sample (1) in a same direction of an arrangement of the solid members (2, 3); detecting fluorescent light generated in the solid members (2, 3) placed in the confocal volume C; and evaluating the optical system A based on the detected fluorescent light.
Bibliography:Application Number: EP20130878233