PROCESS MEASUREMENT SYSTEM WITH VARIABLE AMPLITUDE SENSOR EXCITATION

• Main Author: SCHULTE, John Paul
• Format: Patent
• Language: English; French; German
• Published: 06.12.2017
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the sensor signal to measurement data. A control circuit controls the amplitude of the sensor excitation to maximize signal strength over the enti...