PROCESS MEASUREMENT SYSTEM WITH VARIABLE AMPLITUDE SENSOR EXCITATION

A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the sensor signal to measurement data. A control circuit controls the amplitude of the sensor excitation to maximize signal strength over the enti...

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Bibliographic Details
Main Author SCHULTE, John Paul
Format Patent
LanguageEnglish
French
German
Published 06.12.2017
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Summary:A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the sensor signal to measurement data. A control circuit controls the amplitude of the sensor excitation to maximize signal strength over the entire operating ratio range of the sensor. This enhances resolution and noise rejection of the measurement circuit.
Bibliography:Application Number: EP20140775498