PROCESS MEASUREMENT SYSTEM WITH VARIABLE AMPLITUDE SENSOR EXCITATION
A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the sensor signal to measurement data. A control circuit controls the amplitude of the sensor excitation to maximize signal strength over the enti...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English French German |
Published |
06.12.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the sensor signal to measurement data. A control circuit controls the amplitude of the sensor excitation to maximize signal strength over the entire operating ratio range of the sensor. This enhances resolution and noise rejection of the measurement circuit. |
---|---|
AbstractList | A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the sensor signal to measurement data. A control circuit controls the amplitude of the sensor excitation to maximize signal strength over the entire operating ratio range of the sensor. This enhances resolution and noise rejection of the measurement circuit. |
Author | SCHULTE, John Paul |
Author_xml | – fullname: SCHULTE, John Paul |
BookMark | eNrjYmDJy89L5WRwCQjyd3YNDlbwdXUMDg1y9XX1C1EIjgwOcfVVCPcM8VAIcwzydHTycVVw9A3w8QwJdXFVCHb1C_YPUnCNcPYMcQzx9PfjYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgFGluZGhgaWTobGRCgBAF-cLbI |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
DocumentTitleAlternate | SYSTÈME DE MESURE DE PROCESSUS AVEC EXCITATION DE CAPTEUR À AMPLITUDE VARIABLE PROZESSMESSSYSTEM MIT EINER SENSORANREGUNG MIT VERÄNDERBARER AMPLITUDE |
ExternalDocumentID | EP2972109B1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_EP2972109B13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 15:15:42 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English French German |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_EP2972109B13 |
Notes | Application Number: EP20140775498 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171206&DB=EPODOC&CC=EP&NR=2972109B1 |
ParticipantIDs | epo_espacenet_EP2972109B1 |
PublicationCentury | 2000 |
PublicationDate | 20171206 |
PublicationDateYYYYMMDD | 2017-12-06 |
PublicationDate_xml | – month: 12 year: 2017 text: 20171206 day: 06 |
PublicationDecade | 2010 |
PublicationYear | 2017 |
RelatedCompanies | Rosemount Inc |
RelatedCompanies_xml | – name: Rosemount Inc |
Score | 3.1156673 |
Snippet | A process measurement system includes a sensor for producing a sensor signal as a function of a process parameter and a measurement circuit that converts the... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
Title | PROCESS MEASUREMENT SYSTEM WITH VARIABLE AMPLITUDE SENSOR EXCITATION |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171206&DB=EPODOC&locale=&CC=EP&NR=2972109B1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4QfN4UNeArezC9NfZFSw_E0O0Saiht2op4Im1ZEy6FSI1_39kNoBe9bWaTye4k89yZbwEehNk3TdNRuastVIFGqLq5bahFWTg877mGwcXscDixRy_W86w7a8ByNwsjcUK_JDgialSJ-l5Le73-KWL5srdy81gskbR6GmZ9X9lmx7qjG5qt-F6fxZEfUYVSXCmTpG8IlBrN9TBROsAo2hHdX2zqiaGU9W-PMjyDwxiZVfU5NHjVghO6-3itBcfh9r27BUeyQbPcIHGrhJsL8OMkoig3EjI0iomE4yfpW5qxkLwG2YhMB0kw8MaMDMJ4HGDIx0jKJmmUEDajQSarUpdAhiyjIxUPNt8LYc7i_RXMK2hWq4q3gVi9optrbs_g3XdLK93c4qVmI4Hr-sKx8g50_mRz_c_eDZwKacq-DfsWmvXHJ79D71sX91Ju37aTgsE |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5KfdSbVsX63IPkFsyreRyKNMmWRPMiibWeQpKu0EtabMS_7-7SVi96W2Zh2B2Y5858C3DPzL6qqoZILGkuMjRC0Sp1RazqyiClaSkKYbPDYaR7L9rTbDjrwGI7C8NxQr84OCLVqJrqe8vt9eqniOXy3sr1Q7WgpOXjJB-5wiY7lg1ZkXTBtUc4id3YERyHroQoHSkMpUaybJoo7dEI22Qw-3hqs6GU1W-PMjmG_YQya9oT6JCmDz1n-_FaHw7DzXt3Hw54g2a9psSNEq5PwU3S2KFyQyGmRjHlcPwoe8tyHKJXP_fQdJz6YzvAaBwmgU9DPowyHGVxivDM8XNelToDNMG544n0YMVOCAVOdldQz6HbLBtyAUgzq2EpWaZChu-aVFulRmpJpwQiy3NDKwcw-JPN5T97d9Dz8jAoAj96voIjJlnew6FfQ7f9-CQ31BO31S2X4TcAioWx |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=PROCESS+MEASUREMENT+SYSTEM+WITH+VARIABLE+AMPLITUDE+SENSOR+EXCITATION&rft.inventor=SCHULTE%2C+John+Paul&rft.date=2017-12-06&rft.externalDBID=B1&rft.externalDocID=EP2972109B1 |