SCATTERING DETECTION FROM DOWNHOLE OPTICAL SPECTRA

Obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus, and then obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing...

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Bibliographic Details
Main Authors POP, Julian, HSU, Kai, INDO, Kentaro
Format Patent
LanguageEnglish
French
German
Published 22.05.2019
Subjects
EARTH DRILLING
EARTH DRILLING, e.g. DEEP DRILLING
FIXED CONSTRUCTIONS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MINING
OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR ASLURRY OF MINERALS FROM WELLS
PHYSICS
TESTING
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Summary:Obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus, and then obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus. A wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is then determined based on the first and second optical spectral data, and a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is determined based on the first and second optical spectral data.
Bibliography:Application Number: EP20130860663