A METHOD AND APPARATUS OF PROFILE MEASUREMENT

A system and method for profile measurement based on triangulation involves arrangement of an image acquisition assembly relative to an illumination assembly such that an imaging plane is parallel to a light plane (measurement plane defined by where the light plane impinges on the object), which sup...

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Bibliographic Details
Main Author CHANG, TZYY-SHUH
Format Patent
LanguageEnglish
French
German
Published 20.07.2016
Subjects
DETECTING MASSES OR OBJECTS
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
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Summary:A system and method for profile measurement based on triangulation involves arrangement of an image acquisition assembly relative to an illumination assembly such that an imaging plane is parallel to a light plane (measurement plane defined by where the light plane impinges on the object), which supports uniform pixel resolution in the imaging plane. The image acquisition assembly includes an imaging sensor having a sensor axis and a lens having a principal axis, wherein the lens axis is offset from the imaging axis.
Bibliography:Application Number: EP20130858487