CROWD-SOURCED HARDWARE CALIBRATION

Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the a...

Full description

Saved in:
Bibliographic Details
Main Authors KESSLER, Joshua C, WOJTOWICZ, Marek A, SOLOMON, Peter R, RUBENSTEIN, Yonatan B, RUBENSTEIN, Eric P, DRUKIER, Gordon A
Format Patent
LanguageEnglish
French
German
Published 26.07.2023
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.
Bibliography:Application Number: EP20130852440