SYSTEM FOR CALCULATION OF MATERIAL PROPERTIES USING REFLECTION TERAHERTZ RADIATION AND AN EXTERNAL REFERENCE STRUCTURE

A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to outpu...

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Bibliographic Details
Main Authors WHITE, JEFFREY, S, ZIMDARS, DAVID
Format Patent
LanguageEnglish
French
German
Published 08.06.2016
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to output a signal based on the radiation received by the terahertz receiver.
Bibliography:Application Number: EP20130846546