METHOD FOR MEASURING SURFACE POTENTIALS ON POLARISED DEVICES

A method for measuring the surface potential of a polarized sample includes: measuring the topographic profile of the sample by scanning its surface with a tapered tip connected to a micro-lever activated at the resonance frequency of same by a piezoelectric actuator; placing the tapered tip a const...

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Bibliographic Details
Main Authors MOLINARI, MICHAËL, BERCU, NICOLAE BOGDAN, SIMONETTI, OLIVIER, GIRAUDET, LOUIS, NICOLAS, JEAN-LOUIS
Format Patent
LanguageEnglish
French
German
Published 29.07.2015
Subjects
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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Summary:A method for measuring the surface potential of a polarized sample includes: measuring the topographic profile of the sample by scanning its surface with a tapered tip connected to a micro-lever activated at the resonance frequency of same by a piezoelectric actuator; placing the tapered tip a constant distance away from the topographic profile of the surface obtained during the previous step; and measuring the electrostatic potential of the surface. The sample is not polarized during the step of measuring the topographic profile. The sample is polarized during the measurement of the potential profile.
Bibliography:Application Number: EP20130779256