Multipoint offset sampling deformation techniques

Systems and methods for performing MOS skin deformations are provided. In one example process, the in vector of a MOS transform may be manually configured by a user. In another example process, a slide/bulge operation may be configured to depend on two or more MOS transforms. Each of the MOS transfo...

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Bibliographic Details
Main Authors FARSON, PETER DEAN, GONG, MATTHEW CHRISTOPHER, HUTCHINSON, MICHAEL SCOTT, GREGORY, ARTHUR D, RUBIN, MARK R, HELMS, ROBERT LLOYD
Format Patent
LanguageEnglish
French
German
Published 01.07.2015
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:Systems and methods for performing MOS skin deformations are provided. In one example process, the in vector of a MOS transform may be manually configured by a user. In another example process, a slide/bulge operation may be configured to depend on two or more MOS transforms. Each of the MOS transforms may be assigned a weight that represents the transform's contribution to the overall slide/bulge. In yet another example process, a bulge operation for a MOS vertex may be performed in a direction orthogonal to the attached MOS curve regardless of the direction of the attachment vector. In yet another example process, a ghost transform may be inserted into a MOS closed curve and used to calculate skin deformations associated with first transform of the MOS closed curve.
Bibliography:Application Number: EP20140200508