UNIVERSAL MULTI-DETECTION SYSTEM FOR MICROPLATES

An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a...

Full description

Saved in:
Bibliographic Details
Main Authors ANDERSON, Bill, SEARS, Richard N, ZIMENKOV, Oleg, AMOURETTI, Xavier, MANY, Christopher, TOBEY, Joe, KONTOROVICH, Michael, PIETTE, Ross, VENDITTI, JR., Dan J, NORRIS, Ben, KNIGHT, Ben, PIETTE, James, FERRIS, Brian
Format Patent
LanguageEnglish
French
German
Published 03.05.2023
Subjects
CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
PHYSICS
RADIATION PYROMETRY
TESTING
TRANSPORTING
Online AccessGet full text

Cover

More Information
Summary:An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
Bibliography:Application Number: EP20130797139