System and method for generating high resolution models of a target object

Embodiments of the systems and methods of this disclosure utilize different positions, or poses, of a target object 104 to collect images 112 that can result in high-resolution volumetric models of the target object 104. In one embodiment, the object poses define a lateral position and an axial posi...

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Bibliographic Details
Main Authors NEUSER, EBERHARD, ROTHE, NILS, SUPPES, ALEXANDER
Format Patent
LanguageEnglish
French
German
Published 17.09.2014
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Embodiments of the systems and methods of this disclosure utilize different positions, or poses, of a target object 104 to collect images 112 that can result in high-resolution volumetric models of the target object 104. In one embodiment, the object poses define a lateral position and an axial position (also "angular orientation") of the target object 104 relative to components of an imaging system 102, e.g., the source 106 of an x-ray beam. The imaging system 102 captures an image 112 of the target object 104 in the object poses. Further processing of the image data that relates to the images 112 generates a volumetric model of the target object 104 at higher resolution, or with fewer artifacts, as compared to similar volumetric models that arise from conventional scanning of these large parts.
Bibliography:Application Number: EP20140159044