Fault tolerant fail-safe link

The present disclosure is generally directed to a plurality of solid state switches of varying periphery sizes connected in series between a power source and a load. A built-in test circuit senses an overvoltage condition across one or more of the solid state switches of varying periphery sizes and...

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Bibliographic Details
Main Authors HOLLEY, ROBERT D, LURTON, N. EVAN
Format Patent
LanguageEnglish
French
German
Published 16.04.2014
Subjects
BASIC ELECTRONIC CIRCUITRY
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRICITY
EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
GENERATION
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PULSE TECHNIQUE
TESTING
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Summary:The present disclosure is generally directed to a plurality of solid state switches of varying periphery sizes connected in series between a power source and a load. A built-in test circuit senses an overvoltage condition across one or more of the solid state switches of varying periphery sizes and opens or closes the one or more of the solid state switches of varying periphery sizes in accordance with a measured voltage across at least one solid state switch of the plurality of solid state switches.
Bibliography:Application Number: EP20130187535