METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE

A peak assigning apparatus 1 for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material, capable of contributing to improvement of the accuracy and efficiency of evaluation of an evaluation target, includes a peak...

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Bibliographic Details
Main Authors MORI, Yoshikazu, NODA, Keiichi, MAKINO, Bunsho
Format Patent
LanguageEnglish
French
German
Published 26.08.2020
Subjects
CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
TESTING
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Summary:A peak assigning apparatus 1 for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material, capable of contributing to improvement of the accuracy and efficiency of evaluation of an evaluation target, includes a peak pattern preparing part 7 preparing a peak pattern for each peak of the target FP and a reference FP that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, and a peak assigning part 9 specifying the peaks corresponding to each other by comparison of the peak patterns.
Bibliography:Application Number: EP20120791980