Method of estimating a reflection profile of an optical channel

Proposed is a method of estimating a reflection profile of an optical channel. The method comprises different steps. A measured reflection profile of the optical channel, such as an OTDR trace, is provided. One or more reflection peaks are estimated within the measured reflection profile. A residual...

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Bibliographic Details
Main Authors MEERSMAN, STIJN, CLYBOUW, YANNICK, STRAUB, MICHAEL, HEHMANN, JOERG, VANKEIRSBILCK, RUDI
Format Patent
LanguageEnglish
French
German
Published 29.01.2014
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
TRANSMISSION
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Summary:Proposed is a method of estimating a reflection profile of an optical channel. The method comprises different steps. A measured reflection profile of the optical channel, such as an OTDR trace, is provided. One or more reflection peaks are estimated within the measured reflection profile. A residual reflection profile is determined, by removing the estimated reflection peaks from the measured reflection profile. Furthermore, a modified residual reflection profile is determined, by modifying one or more estimated crosstalk frequency components within the residual reflection profile. Finally, the estimated reflection profile is determined, by superposing the estimated reflection peaks and the modified residual reflection profile.
Bibliography:Application Number: EP20120305674