Ultrasonic modeling for inspection of composite irregularities

A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity (270, 450) parameter. The first simulated inspection is conducted using a first evaluation setting. A first image (572) is produced based on the first waveform set, and it is...

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Bibliographic Details
Main Authors Lin, John Z, Bossi, Richard H, Tat, Hong
Format Patent
LanguageEnglish
French
German
Published 26.08.2020
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Summary:A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity (270, 450) parameter. The first simulated inspection is conducted using a first evaluation setting. A first image (572) is produced based on the first waveform set, and it is determined whether a quality of the first image (572) satisfies a predetermined threshold.
Bibliography:Application Number: EP20130150766