FORCE CURVE ANALYSIS METHOD FOR PLANAR OBJECT LEVELING

• Main Authors: NELSON, MICHAEL, R, BUSSAN, JOHN, EDWARD, VAL-KHVALABOV, VADIM, SOLHEIM, EDWARD, R, HAAHEIM, JASON, R, MOSKAL, JOHN
• Format: Patent
• Language: English; French; German
• Published: 06.03.2013
• Subjects: APPARATUS SPECIALLY ADAPTED THEREFOR; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES; MATERIALS THEREFOR; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; NANOTECHNOLOGY; ORIGINALS THEREFOR; PERFORMING OPERATIONS; PHOTOGRAPHY; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES; PHYSICS; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; TRANSPORTING