ULTRASOUND PROBE, PRODUCTION METHOD THEREFOR, AND ULTRASOUND DIAGNOSTIC EQUIPMENT

Disclosed is an ultrasonic probe wherein the warpage of a CMUT due to thermal stress produced at the joint between a backing layer and the CMUT is minimized, thereby improving the durability of the bond between the CMUT and the backing layer. To accomplish this the ultrasonic probe is provided with:...

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Bibliographic Details
Main Authors SAKO,Akifumi, FUKADA,Makoto, ISHIDA,Kazunari
Format Patent
LanguageEnglish
French
German
Published 31.05.2017
Subjects
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Summary:Disclosed is an ultrasonic probe wherein the warpage of a CMUT due to thermal stress produced at the joint between a backing layer and the CMUT is minimized, thereby improving the durability of the bond between the CMUT and the backing layer. To accomplish this the ultrasonic probe is provided with: a CMUT (20) having vibratory elements that change the electromechanical coupling coefficient or sensitivity according to the bias voltage to be applied; a backing layer (22) adhered to the rear side of the ultrasonic transmission surface of the CMUT (20) ; and a thermal-stress balancing member (24) to be adhered to the backing layer (22) while being disposed facing the CMUT (20) in such a manner that the backing layer (22) is sandwiched therebetween so as to minimize the warpage of the CMUT (20) due to thermal stress produced between the CMUT (20).
Bibliography:Application Number: EP20110771867