ACCURACY ENHANCING MECHANISM AND METHOD FOR CURRENT MEASURING APPARATUS

An optical interferometer used to measure the current in a conductor, where the gap between the mirror and the quarter wave plate is minimized, and the gap is shielded magnetically. Additionally, at least the modulator is shielded, and preferably the case containing many of the components, such as t...

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Bibliographic Details
Main Authors MASRI, Farid, E, SHERMAN, Christopher, S
Format Patent
LanguageEnglish
French
German
Published 21.02.2018
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING ELECTRIC VARIABLES
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An optical interferometer used to measure the current in a conductor, where the gap between the mirror and the quarter wave plate is minimized, and the gap is shielded magnetically. Additionally, at least the modulator is shielded, and preferably the case containing many of the components, such as the integral number of turns of optical fiber in a coil, is magnetically shielded. By shielding the components, and reducing the gap between the quarter wave plate and the mirror, the error in the current measurement is substantially reduced.
Bibliography:Application Number: EP20080838669