Profile measuring instrument and profile measuring method

• Main Authors: Noda, Takashi, Kikuchi, Naoya, Ogura, Katsuyuki, Sakamoto, Shinjiro
• Format: Patent
• Language: English; French; German
• Published: 02.10.2019
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

A coordinate measuring machine (1) includes: a reference gauge measuring part (51) for measuring a diameter or radius of a reference gauge along an axial direction in a reference gauge coordinate system set for the reference gauge having a known diameter or radius; a correction function generating part (52) for generating a correction function based on a difference between the diameter or radius of the reference gauge measured by the reference gauge measuring part (51) and the known diameter or radius and a measuring point of the reference gauge measuring part (51); a measuring part (53) for measuring a workpiece in a workpiece coordinate system set for the workpiece; a first transformer (54) for transforming a measurement value measured by the measuring part (53) in the workpiece coordinate system into the reference gauge coordinate system; a corrector (55) for correcting the measurement value transformed into the reference gauge coordinate system by the first transformer by a correction function generated by the correction function generating part (52); and a second transformer (56) for transforming the measurement value corrected by the corrector (55) in the reference gauge coordinate system into the workpiece coordinate system.