Method for determining the locations of at least two impacts

• Main Authors: DUHEILLE, REMI, KIRI ING, ROS, SCHEVIN, OLIVIER
• Format: Patent
• Language: English; French; German
• Published: 08.02.2012
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention relates to a method for determining the locations of at least two impacts F 1 and F 2 on a surface using one or more sensors S i , i = 1 to n, with n being the number of sensors, said impacts F 1 and F 2 generating a signal being sensed by the one or more sensors, wherein each sensor provides a sensed signal s i (t), i = 1 to n, with n being the number of sensors. To be able to determine simultaneous impacts of different amplitudes the method comprises the steps of: identifying the location x of one impact, and determining a modified sensed signal s i ' (t) for each sensor in which the contribution due to the identified impact is reduced and which is based on a comparison, in particular a correlation, of each of the sensed signals s i (t) and a predetermined reference signal r ij (t) corresponding to a reference impact R j at location j. The invention also relates to methods based on couples of sensed signals and to a device carrying out the inventive methods.