ANALYTICAL SYSTEM COMPRISING AN ARRANGEMENT FOR TEMPORALLY VARIABLE SPATIAL LIGHT MODULATION AND DETECTION METHOD IMPLEMENTED THEREBY

The invention relates to an analytical system and method for generating and metering optical signals. The invention includes an optical system having an illuminating system and a sensor platform. The illuminating system includes an arrangement identified as "SLM" for the temporally rapidly...

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Bibliographic Details
Main Author WIKI, MAX
Format Patent
LanguageEnglish
French
German
Published 08.04.2009
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The invention relates to an analytical system and method for generating and metering optical signals. The invention includes an optical system having an illuminating system and a sensor platform. The illuminating system includes an arrangement identified as "SLM" for the temporally rapidly variable spatial light modulation, by which in an operating state, illuminating patterns of a freely selectable and rapidly variable geometry, which can be determined by the settings of the SLM, can be generated on the sensor platform from an illuminating light, which enters into this SLM and which includes a substantially homogenous intensity distribution in the in the cross section of the illuminating light at right angles to its direction of expansion.
Bibliography:Application Number: EP20070805169