OPEN CIRCUIT DELAY DEVICES AND METHOD FOR ANALYTE MEASUREMENT

• Main Authors: Docherty, Edward, Kermani, Mahyar Z, McInulty, John
• Format: Patent
• Language: English; French; German
• Published: 27.09.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

System, circuits, and methods to reduce or eliminate uncompensated voltage drop between an electrode of an electrochemical cell usable for analyte measurement. In one example, a system is provided that includes a test strip, a reference voltage circuit, an operational amplifier connected to the reference voltage circuit to provide a pre-determined fraction of a reference voltage substantially equal to the test voltage applied to the first line, the operational amplifier having an output configured for one of a connected or disconnected state to the first line, and a processing circuit connected to the output of the operational amplifier and the first line such that, during a disconnected state between the output and the first line, the processing circuit remains in connection with the first line. In another example, a method of measuring an electrochemical reaction of an electrochemical cell is provided that includes applying a test voltage to the first electrode and connecting the second electrode to ground; uncoupling the first electrode from the output of the circuit while allowing electrical communication from the first electrode to the processor; and coupling the first electrode to the output to measure a test current generated in the electrochemical cell without an uncompensated voltage drop.