X-RAY INSPECTION BASED ON SCATTER DETECTION

Systems and methods for inspecting an object with a scanned beam of penetrating radiation are disclosed. Scattered radiation from the beam is detected, in either the backward or forward direction. Characteristic values of the backscattered radiation are compared to expected reference values to chara...

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Bibliographic Details
Main Authors SAPP, WILLIAM, WADE, JR, SCHUELLER, RICHARD, CALLERAME, JOSEPH, SCHUBERT, JEFFREY, CASON, WILLIAM, RANDAL, ROTHSCHILD, PETER, BAUKUS, WILLIAM, J
Format Patent
LanguageEnglish
French
German
Published 30.07.2008
Subjects
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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Summary:Systems and methods for inspecting an object with a scanned beam of penetrating radiation are disclosed. Scattered radiation from the beam is detected, in either the backward or forward direction. Characteristic values of the backscattered radiation are compared to expected reference values to characterize the object. Additionally, penetrating radiation transmitted through the inspected object may be combined with scatter information. In certain embodiments, the inspected field of view is less than 0.1 steradians, and the detector is separate from the source of penetrating radiation and is disposed, with respect to the object, such as to subtend greater than 0.5 steradians in the field of view of the object.
Bibliography:Application Number: EP20060846136