Automatic analyzer

• Main Authors: Suzuki, Atsushi, Yagi, Kenichi, Teshigawara, Kenji, Noda, Takayuki, Takahashi, Kenichi
• Format: Patent
• Language: English; French; German
• Published: 21.03.2018
• Subjects: GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION; TECHNICAL SUBJECTS COVERED BY FORMER USPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS; TESTING

The present invention provides an automatic analysis system that is capable of quickly performing reinspection The automatic analysis system comprises: a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and control means for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.