POLARIZATION MICROSCOPE

• Main Authors: SAITO, YOSHIHARU, NAKASHO, EIJI, TAKATSUKA, HIROFUMI
• Format: Patent
• Language: English; French; German
• Published: 01.09.2010
• Subjects: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS

It in an object to acquire a high-precision polarization image. Provided is a polarization microscope comprising an illumination optical system 3 including a light source, a polarizer for converting a polarization state of illumination light from the light source, and a condenser lens for condensing the illumination light transmitted through the polarizer onto a specimen; an image-acquisition optical system including an objective lens for collecting observation light from the specimen, an analyzer for converting a polarization state of the observation light collected by the objective lens, and an image-acquisition device for acquiring the observation light transmitted through the analyzer; an observation-light angle correcting element for correcting changes in rotation angle of a polarization plane of the observation light in the image-acquisition optical system; and an observation-light phase-difference correcting element for correcting changes in phase difference between P-polarization and S-polarization of the observation light in the image-acquisition optical system, wherein amounts of correction of these correcting elements vary in directions intersecting an optical axis.