X-Ray detector with radiation hard photodiode design

A photodetector (16) for X-ray applications is disclosed incorporating a photodiode (34, 64) design with reduced leakage at each pixel location. The photodiode is of a reduced surface area and has a peripheral edge of reduced length. The length may be minimized by making the photodiode round. The di...

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Bibliographic Details
Main Authors Albagli, Douglas, Hennessy, William Andrew, Couture, Aaron Judy, Zelakiewicz, Scott Stephen
Format Patent
LanguageEnglish
French
German
Published 22.03.2017
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:A photodetector (16) for X-ray applications is disclosed incorporating a photodiode (34, 64) design with reduced leakage at each pixel location. The photodiode is of a reduced surface area and has a peripheral edge of reduced length. The length may be minimized by making the photodiode round. The diode is surrounded by a reflective layer (66) that may act as a contact for the diode. Photons are reflected by the reflective layer back towards the reduced area diode to maintain good sensitivity. The reflective/contact layer may form a capacitor with another contact layer (54) by disposing a dielectric layer (56) therebetween, thereby increasing the effective capacitance of the photodiode.
Bibliography:Application Number: EP20060126114