Mask formation over an integrated electronic circuit
The method involves forming a buried cavity (C) in a substrate (100) of an integrated electronic circuit, and heating the substrate to close the cavity by creating a recess at right of the cavity. The recess is partially filled with a residual portion to attenuate radiation reflected by the substrat...
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Main Authors | , , |
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Format | Patent |
Language | English French German |
Published |
30.12.2009
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Subjects | |
Online Access | Get full text |
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Summary: | The method involves forming a buried cavity (C) in a substrate (100) of an integrated electronic circuit, and heating the substrate to close the cavity by creating a recess at right of the cavity. The recess is partially filled with a residual portion to attenuate radiation reflected by the substrate, and a lithographic resin layer (3) is formed on the circuit. The layer is exposed to radiation flux, where flux or its duration is adjusted so that a quantity of radiation corresponding to sum of two radiation fluxes is higher than developed threshold of the layer. An independent claim is also included for an integrated electronic circuit comprising a substrate. |
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Bibliography: | Application Number: EP20060290900 |