Mask formation over an integrated electronic circuit

The method involves forming a buried cavity (C) in a substrate (100) of an integrated electronic circuit, and heating the substrate to close the cavity by creating a recess at right of the cavity. The recess is partially filled with a residual portion to attenuate radiation reflected by the substrat...

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Bibliographic Details
Main Authors BUSTOS, JESSY, THONY, PHILIPPE, CORONEL, PHILIPPE
Format Patent
LanguageEnglish
French
German
Published 30.12.2009
Subjects
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Summary:The method involves forming a buried cavity (C) in a substrate (100) of an integrated electronic circuit, and heating the substrate to close the cavity by creating a recess at right of the cavity. The recess is partially filled with a residual portion to attenuate radiation reflected by the substrate, and a lithographic resin layer (3) is formed on the circuit. The layer is exposed to radiation flux, where flux or its duration is adjusted so that a quantity of radiation corresponding to sum of two radiation fluxes is higher than developed threshold of the layer. An independent claim is also included for an integrated electronic circuit comprising a substrate.
Bibliography:Application Number: EP20060290900