VARIABLE CURRENT SINKING FOR COARSE/FINE PROGRAMMING OF NON-VOLATILE MEMORY

A non-volatile memory device is programmed by first performing a coarse programming process and subsequently performing a fine programming process. The coarse/fine programming methodology is enhanced by using an efficient verification scheme that allows some non-volatile memory cells to be verified...

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Bibliographic Details
Main Authors GUTERMAN, DANIEL, C, MOKHLESI, NIMA, FONG, YUPIN
Format Patent
LanguageEnglish
French
German
Published 05.10.2011
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Summary:A non-volatile memory device is programmed by first performing a coarse programming process and subsequently performing a fine programming process. The coarse/fine programming methodology is enhanced by using an efficient verification scheme that allows some non-volatile memory cells to be verified for the coarse programming process while other non-volatile memory cells are verified for the fine programming process. The fine programming process can be accomplished using current sinking, charge packet metering or other suitable means.
Bibliography:Application Number: EP20050711926