Eddy current array probes with enhanced drive fields

Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP (10) includes a number of EC channels (12) and a number of drive coils (14). Each of the drive coils is provided for a respective one of the EC channels. The drive coils have a...

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Bibliographic Details
Main Authors WANG, CHANGTING, NATH, SHRIDHAR CHAMPAKNATH, PLOTNIKOV, YURI ALEXEYEVICH, ERTEL, JOHN WILLIAM, TOGO, MOTTITO, HENNESSY, WILLIAM ANDREW, MCKNIGHT, WILLIAM STEWART, GAMBRELL, GIGI OLIVE, MANDAYAM, SHYAMSUNDER TONDANUR
Format Patent
LanguageEnglish
French
German
Published 26.07.2006
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP (10) includes a number of EC channels (12) and a number of drive coils (14). Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP (40) for detecting flaws in a number of scanning and orientation configurations includes at least one substrate (32), a number of sense coils (16, 18) arranged on the substrate(s), and a drive coil (14) encompassing all of the sense coils. In another arrangement, an ECAP includes a substrate sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
Bibliography:Application Number: EP20050257839