OPTICAL INTERROGATION SYSTEM AND METHOD FOR USING SAME

Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array.

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Bibliographic Details
Main Authors FONTAINE, NORMAN, H, CARRACCI, STEPHEN, J
Format Patent
LanguageEnglish
French
German
Published 22.03.2006
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array.
Bibliography:Application Number: EP20040752701