METHOD AND APPARATUS FOR MONITORING PARTS IN A MATERIAL PROCESSING SYSTEM

The present invention presents an improved apparatus and method for monitoring parts in a material processing system, wherein the material processing system includes a processing tool, a number of RF-responsive part identifiers coupled to the processing tool to generate and transmit part ID data, an...

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Bibliographic Details
Main Author KLEKOTKA, JAMES, E
Format Patent
LanguageEnglish
French
German
Published 28.09.2005
Edition7
Subjects
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Summary:The present invention presents an improved apparatus and method for monitoring parts in a material processing system, wherein the material processing system includes a processing tool, a number of RF-responsive part identifiers coupled to the processing tool to generate and transmit part ID data, and a sensor interface assembly (SIA) configured to receive the part ID data from the plurality of RF-responsive part identifiers.
Bibliography:Application Number: EP20030813967