Loaded-board, guided-probe test fixture

A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited...

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Bibliographic Details
Main Authors SLUTZ, ROBERT, A, SAYRE, TRACY, L, KANACK, KRIS, J
Format Patent
LanguageEnglish
French
German
Published 09.03.2005
Edition7
Subjects
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PRINTED CIRCUITS
TESTING
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Summary:A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).
Bibliography:Application Number: EP20040027686