Method and apparatus for imaging specific elements using X-rays

An apparatusÄ11, 50Ü for imaging features of an objectÄ14Ü constructed from a material that includes a first element in the presence of features constructed from a material that includes a second element. The apparatusÄ11, 50Ü utilizes a filtered x-ray spectrum to image the objectÄ14Ü. The filtered...

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Bibliographic Details
Main Author ROSNER, JEFFREY, S
Format Patent
LanguageEnglish
French
German
Published 14.01.2004
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An apparatusÄ11, 50Ü for imaging features of an objectÄ14Ü constructed from a material that includes a first element in the presence of features constructed from a material that includes a second element. The apparatusÄ11, 50Ü utilizes a filtered x-ray spectrum to image the objectÄ14Ü. The filtered x-ray spectrum is generated from a polychromatic x-ray sourceÄ11, 21Ü having energies below a maximum energy. The maximum energy is greater than a dominant absorption edge of the first element. The filterÄ13, 33Ü includes a filter element having a dominant absorption edge greater than or equal to a dominant absorption edge of the second element. The filterÄ13, 33Ü removes x-rays that would otherwise be absorbed by the second element, thereby improving the relative contrast of images based on x-ray absorption of the first element.
Bibliography:Application Number: EP20030001969